TY  - THES
T1  - Characterisation of nanomaterials by X-ray diffraction profile analysis using the regularisation technique
A1  - Piskarov,Vladyslav
Y1  - 2008/03/10
N2  - For the deconvolution of the instrumental function in X-ray diffraction profile analysis the implementation of an eigenfunction method with different regularisation techniques is investigated and a simple regularisation algorithm is proposed. A simulation of an instrumental-broadened profile superimposed with random noise and background signals is used to investigate the reliability and efficiency of the proposed deconvolution technique. For the simulation an experimentally defined instrument function based on an accurate mathematical model for Cu emission profile and the geometry of the diffractometer is used. The parameters for this instrumental function are obtained by least squares fitting of experimental data resulting from standard reference materials. The proposed method is successfully applied to the experimental X-ray diffraction data for nanostructured CeO2, gold and gold alloys. Compared to established algorithms, it is faster and more reliable in terms of stability, especially in the case of large experimental noise.
KW  - Röntgendiffraktometrie
KW  - Regularisierungsverfahren
KW  - Nanostrukturiertes Material
CY  - Saarbrücken
PB  - Universitäts- und Landesbibliothek
AD  - Postfach 151141, 66041 Saarbrücken
UR  - http://scidok.sulb.uni-saarland.de/volltexte/2008/1447
ER  -