@conferenceObjectPart{MöcklLloydArzt_1993,
title={Electromigration induced resistance changes in passivated aluminum thin film conductors},
author={Möckl, U. E. and Lloyd, J. R. and Arzt, Eduard},
isbn={1-558-99205-7},
doi={http://dx.doi.org/10.22028/D291-23836},
year={1993}
}