Please use this identifier to cite or link to this item:
doi:10.22028/D291-24255
Title: | Sol-gel deposited Sb-doped tin oxide films |
Author(s): | Guglielmi, M. Menegazzo, E. Paolizzi, M. Gasparro, Guido Ganz, Dietmar Pütz, Jörg Aegerter, Michel A. Pascual, c. Durán, Alicia Hubert-Pfalzgraf, L. Willems, H. X. Van Bommel, M. Büttgenbach, L. Costa, L. |
Language: | English |
Year of Publication: | 1998 |
OPUS Source: | Journal of sol-gel science and technology. - 13. 1998, S. 679-683 |
SWD key words: | Antimon Zinn Oxide Ringversuch Reflexion <Physik> Reflektometrie Korngrenze |
DDC notations: | 620 Engineering and machine engineering |
Publikation type: | Journal Article |
Abstract: | The structural, electrical and optical properties of single sol-gel derived antimony-doped tin oxide (ATO) films sintered at 550°C have been measured. The reproducibility of both the preparation and the characterization procedures have been tested by a round-robin test involving eight laboratories within a Concerted European Action (CEA) project. The resistivity measured as a function of Sb content has been obtained by electric and reflectance and transmission measurements. Their differences are discussed in terms of structural and grain boundary effects. An increase of Sb content results in a decrease of the crystallite size (7.0 to 5.4 nm) and a greater influence of the grain boundary. |
Link to this record: | urn:nbn:de:bsz:291-scidok-24954 hdl:20.500.11880/24311 http://dx.doi.org/10.22028/D291-24255 |
Date of registration: | 12-Dec-2009 |
Faculty: | SE - Sonstige Einrichtungen |
Department: | SE - INM Leibniz-Institut für Neue Materialien |
Collections: | INM SciDok - Der Wissenschaftsserver der Universität des Saarlandes |
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