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doi:10.22028/D291-34691
Title: | Resolution Models for Energy-Filtered TEM Imaging over Thick Liquid or Amorphous Layers |
Author(s): | Ortega, Eduardo de Jonge, Niels |
Language: | English |
Title: | Microscopy and microanalysis : the official journal of the Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada |
Volume: | 27 |
Issue: | S1 |
Startpage: | 802 |
Endpage: | 803 |
Publisher/Platform: | Cambridge University Press |
Year of Publication: | 2021 |
Publikation type: | Journal Article |
DOI of the first publication: | 10.1017/S1431927621003184 |
URL of the first publication: | https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/resolution-models-for-energyfiltered-tem-imaging-over-thick-liquid-or-amorphous-layers/57EAE83BCD2D4A1D18657E924C05E39A |
Link to this record: | hdl:20.500.11880/31763 http://dx.doi.org/10.22028/D291-34691 |
ISSN: | 1435-8115 1431-9276 |
Date of registration: | 17-Sep-2021 |
Faculty: | NT - Naturwissenschaftlich- Technische Fakultät |
Department: | NT - Physik |
Professorship: | NT - Keiner Professur zugeordnet |
Collections: | SciDok - Der Wissenschaftsserver der Universität des Saarlandes |
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